Instruments of the NAMIP-Group

Cameca NanoSIMS 50 Ion Probe

The Cameca NanoSIMS 50 ion microprobe was delivered to the Max Planck Institute for Chemistry in spring 2001. The Nanosims 50 (Fig. 1) is a new type of secondary ion mass spectrometer that is characterized by three fundamental features:

(1) High lateral resolution (down to <50 nanometers for Cs+ primary ions and 150 nanometers for O- primary ions).

(2) High detection efficiency for secondary ions (i.e., high transmission through the mass spectrometer) at high mass resolution).

(3) Parallel detection of up to five isotopes. The combination of these features is unique to the NanoSIMS 50, making it a valuable tool for research projects in cosmochemistry,  aerosol chemistry, microbiology and geochemistry.

The NanoSIMS 50 is primarily used for the study of presolar grains and aerosol particles and it has been named MADONNA (MAinz Dust Observatory for the Detection of Nanoscale Nuclear Anomalies).

Leo 1530 Field Emission Electron Microscope

1 EDX; 2 BSD; 3 EBSD; 4 Cathodoluminescence
1 EDX; 2 BSD; 3 EBSD; 4 Cathodoluminescence

The LEO 1530 is a high resolution field emission scanning electron microscope (SEM), which together with an energy dispersive x-ray analysis (EDX X-MAX 80 system from OXFORD Instruments) provides the ability to visualise surface features in the nm-size range and to determine chemical compositions of material as small as 0.3 microns in diameter. This makes SEM/EDX a perfect system for the analysis of extraterrestrial materials, minerals, contaminant particles, and particles collected by filtration.

Link to SEM Gallery

Resolution: 1 kV / 3 nm, 20 kV / 1 nm
Magnification: 20X to 900,000X
Accelerating Voltage: 200 V to 30 kV
Probe Current: 4 pA to 10 nA
Electron Gun: Thermal field emission type
Specimen Stage: x=75 mm, y=75 mm, z=25 mm (all motorized)
Detectors: In-Lens annular, Secondary Electron (SED), Backscattered (BSD)
EDX: Working distance 8.5 mm
Image Processing: Pixel averaging, frame integration, continuous averaging
Image Resolution: 512 x 384 to 3072 x 2304 pixel

Cameca IMS3f Ion Probe

The Max Planck Institute for Chemistry runs a modified Cameca IMS3f ion microprobe. On this page you find a technical description of this instrument.


  • O-, O2+, or Cs+ primary ion beam
  • Secondary ion mass range from H to U
  • Mass resolution power M/DM up to 8000
  • SEM secondary ion counting system, or Faraday Cup ion current measurement
  • Microchannel plate / Fluorescent screen detector for use as a secondary ion microscope


  • CCD camera mounted for secondary ion imaging
  • Improved peripheral electronics for better voltage stability
  • Customized software for isotopic analyses, written in LabVIEW
  • Automated ion imaging mode fully integrated to control software
  • Customized software for rare-earth-element analyses